SEM resolution is limited to ~0.5 nm, while with the recent development in aberration-corrected TEMs, images with spatial resolution of even less than 50 pm have been reported. Moreover, one of the most pronounced differences between the two methods is the optimal spatial resolution that they can achieve. As a result, TEM offers invaluable information on the inner structure of the sample, such as crystal structure, morphology, and stress state information, while SEM provides information on the sample’s surface and its composition. The transmission electron microscopy (TEM) principle, as the name suggests, is to use the transmitted electrons, the electrons that are passing through the sample before they are collected. SEMs use a specific set of coils to scan the beam in a raster-like pattern and collect the scattered electrons. A series of electromagnetic and electrostatic lenses to control the shape and trajectory of the electron beamĪll of these components are housed inside a chamber that is under high vacuum.For both techniques, electrons are used to acquire images of samples. Working principle of scanning electron microscopes and transmission electron microscopes The main difference between SEM and TEM is that SEM creates an image by detecting reflected or knocked-off electrons, while TEM uses transmitted electrons (electrons that are passing through the sample) to create an image. As a result, TEM offers valuable information on the inner structure of the sample, such as crystal structure, morphology and stress state information, while SEM provides information on the sample’s surface and its composition. Here, we briefly describe their similarities and differences. The two main types of electron microscopes are the transmission electron microscope (TEM) and the scanning electron microscope (SEM). Their versatility and extremely high spatial resolution render them a very valuable tool for many applications. Electron microscopes have emerged as a powerful tool for the characterization of a wide range of materials.
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